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EBSD and XRD (X-Ray Diffraction) are useful analytical methods for evaluating distortion.
There are two types of dislocations: GN dislocations, which involve a change in crystal orientation, and SS dislocations, which do not involve a change in crystal orientation. EBSD can only detect GN dislocations, while XRD can detect both GN and SS dislocations.
Adopting a calculation method devised by a specialized research laboratory at Kyushu University focused on steel materials! Accurately evaluating dislocation density.
Our company conducts dislocation density evaluation using X-ray diffraction (XRD). X-ray diffraction (XRD) is one method for evaluating crystalline materials, and the diffraction profile is affected by lattice defects such as dislocations, allowing for the measurement of dislocation density. By adopting a computational method devised by the Kyushu University laboratory, specialized in steel materials (DF/mWH method), we can accurately evaluate dislocation density. 【Features】 - Adoption of a computational method devised by the Kyushu University laboratory, specialized in steel materials - Capability to accurately evaluate dislocation density - Dislocation density can be determined by theoretically calculating peak width *For more details, please refer to the related links or feel free to contact us.
